Reliability Mechanisms for Very large Storage Systems
Appeared in Proceedings of the 20th IEEE / 11th NASA Goddard Conference on Mass Storage Systems and Technologies.
Publication date:
April 2003
        Authors:
        
            
                Qin Xin
            
        
            
                Ethan L. Miller
            
        
            
                Thomas Schwarz
            
        
            
                Darrell D. E. Long
            
        
            
                Scott A. Brandt
            
        
            
                Witold Litwin
            
        
    
        Projects:
        
            Reliable Storage
        
            Ultra-Large Scale Storage
        
    
Available media
Full paper text: PDF
Bibtex entry
@inproceedings{xin-msst03,
  author       = {Qin Xin and Ethan L. Miller and Thomas Schwarz and Darrell D. E. Long and Scott A. Brandt and Witold Litwin},
  title        = {Reliability Mechanisms for Very large Storage Systems},
  booktitle    = { Proceedings of the 20th IEEE / 11th NASA Goddard Conference on Mass Storage Systems and Technologies},
  pages        = {146-156},
  month        = apr,
  year         = {2003},
}
    
